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au.\*:("KWON, Sik-Chol")

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Ferroelectric (Bi, Dy)4Ti3O12 thin films deposited on Pt(1 1 1)/Ti/SiO2/Si and p-type Si(100) substratesSANG SU KIM; SONG, Jae-Sung; KWON, Sik-Chol et al.Journal of crystal growth. 2004, Vol 271, Num 1-2, pp 90-98, issn 0022-0248, 9 p.Article

Influence of boric acid on the electrodepositing process and structures of Ni-W alloy coatingYIYONG WU; DOYEN CHANG; KIM, Dongsoo et al.Surface & coatings technology. 2003, Vol 173, Num 2-3, pp 259-264, issn 0257-8972, 6 p.Article

Ni-W alloy electrodeposition from a bath containing an organic amine substitute for inorganic ammoniaYIYONG WU; CHANG, Do-Yon; KWON, Sik-Chol et al.Plating and surface finishing. 2003, Vol 90, Num 2, pp 46-49, issn 0360-3164, 4 p.Article

Effects of hydrogen gas on properties of tin-doped indium oxide films deposited by radio frequency magnetron sputtering methodKIM, Do-Geun; LEE, Sunghun; LEE, Gun-Hwan et al.Thin solid films. 2007, Vol 515, Num 17, pp 6949-6952, issn 0040-6090, 4 p.Article

Effects of 2-butyne-1,4-diol on structures and morphologies of electroplating Ni-W alloyWU, Yiyong; CHANG, Do-Yon; KIM, Dong-Soo et al.Surface & coatings technology. 2003, Vol 162, Num 2-3, pp 269-275, issn 0257-8972, 7 p.Article

The influence of counterface materials and humidity on the tribological behavior of arc ion plated TiN filmsYOON, Seog-Young; KANG, Myung-Chang; KWON, Sik-Chol et al.Surface & coatings technology. 2002, Vol 157, Num 2-3, pp 144-150, issn 0257-8972Article

Effect of ion mass and charge state on transport of vacuum arc plasmas through a biased magnetic filterBYON, Eungsun; KIM, Jong-Kuk; KWON, Sik-Chol et al.IEEE transactions on plasma science. 2004, Vol 32, Num 2, pp 433-439, issn 0093-3813, 7 p., 1Conference Paper

Effect of ion implantation on growth of thermally grown oxide in MCrAlY coating for TBCBYON, Eungsun; SHIHONG ZHANG; LEE, Sung-Hun et al.Surface & coatings technology. 2010, Vol 205, issn 0257-8972, S435-S438, SUP1Conference Paper

Plasma processing for surface modification of trivalent chromium as alternative to hexavalent chromium layerKWON, Sik-Chol; LEE, Hak-Jun; KIM, Jong-Kuk et al.Surface & coatings technology. 2007, Vol 201, Num 15, pp 6601-6605, issn 0257-8972, 5 p.Conference Paper

Application of small angle neutron scattering to analyze precision nickel mesh for electro-magnetic interference shielding formed by continuous electroforming techniqueKIM, Man; LEE, Joo-Yul; KWON, Sik-Chol et al.Physica. B, Condensed matter. 2006, Vol 385-86, pp 914-916, issn 0921-4526, 3 p., 2Conference Paper

Effect of metal ion implantation on thermal instability of diamond-like carbon filmsBYON, Eungsun; KIM, Jong-Kuk; RHA, Jong-Joo et al.Surface & coatings technology. 2007, Vol 201, Num 15, pp 6670-6673, issn 0257-8972, 4 p.Conference Paper

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